JPH032401B2 - - Google Patents

Info

Publication number
JPH032401B2
JPH032401B2 JP58208179A JP20817983A JPH032401B2 JP H032401 B2 JPH032401 B2 JP H032401B2 JP 58208179 A JP58208179 A JP 58208179A JP 20817983 A JP20817983 A JP 20817983A JP H032401 B2 JPH032401 B2 JP H032401B2
Authority
JP
Japan
Prior art keywords
light
spf
measurement
polarization
optical fiber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58208179A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60100002A (ja
Inventor
Hiroshi Kawakami
Toshio Iizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP58208179A priority Critical patent/JPS60100002A/ja
Publication of JPS60100002A publication Critical patent/JPS60100002A/ja
Publication of JPH032401B2 publication Critical patent/JPH032401B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Optical Transform (AREA)
JP58208179A 1983-11-04 1983-11-04 偏波面保存光フアイバを用いた光干渉計 Granted JPS60100002A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58208179A JPS60100002A (ja) 1983-11-04 1983-11-04 偏波面保存光フアイバを用いた光干渉計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58208179A JPS60100002A (ja) 1983-11-04 1983-11-04 偏波面保存光フアイバを用いた光干渉計

Publications (2)

Publication Number Publication Date
JPS60100002A JPS60100002A (ja) 1985-06-03
JPH032401B2 true JPH032401B2 (en]) 1991-01-16

Family

ID=16551965

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58208179A Granted JPS60100002A (ja) 1983-11-04 1983-11-04 偏波面保存光フアイバを用いた光干渉計

Country Status (1)

Country Link
JP (1) JPS60100002A (en])

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6227603A (ja) * 1985-07-29 1987-02-05 Hitachi Ltd 変位の光学的測定装置
JPH01100403A (ja) * 1987-10-13 1989-04-18 Topcon Corp 干渉計用光源装置
US5182639A (en) * 1991-10-30 1993-01-26 Suganda Jutamulia Real-time analytic pseudocolor encoder system

Also Published As

Publication number Publication date
JPS60100002A (ja) 1985-06-03

Similar Documents

Publication Publication Date Title
US20050174578A1 (en) High efficiency low coherence interferometry
EP0793079A2 (en) Fiber coupled interferometric displacement sensor
CN108534686B (zh) 一种无零漂外差式激光多普勒测量光纤光路及测量方法
JP2001349872A (ja) 磁気センサ
JPS6159224A (ja) 準単色光線の偏光状態を実時間測定するための方法と装置
JPH0663867B2 (ja) 波面状態検出用の干渉装置
US5517022A (en) Apparatus for measuring an ambient isotropic parameter applied to a highly birefringent sensing fiber using interference pattern detection
JPS61219803A (ja) 物理量測定装置
US4832492A (en) Heterodyne michelson interferometer for polarization measurements
CN108061527A (zh) 一种抗空气扰动的二维激光自准直仪
JPH032401B2 (en])
JP3131242B2 (ja) 光ビーム入射角の測定方法、測定装置及び該装置を距離測定に使用する方法
JPS5990003A (ja) 干渉測定装置
RU2638582C1 (ru) Двухканальная интерферометрическая система для исследования ударно-волновых процессов
JPS6352694B2 (en])
JP2696117B2 (ja) ビーム分岐光学系を用いたレーザドップラ振動計
US6495999B1 (en) Method and device for measuring a magnetic field with the aid of the faraday effect
JP2592254B2 (ja) 変位量及び変位速度の測定装置
JP3499044B2 (ja) 微少変位量測定方法及び装置
GB796661A (en) Optical arrangement for comparing the transmission ratio of a sample with a standard
RU2069839C1 (ru) Устройство для определения поперечных смещений
US20200182607A1 (en) Dual-sensor arrangment for inspecting slab of material
JPS59228128A (ja) 偏波面保存光フアイバを用いた光センサ
CN110375643B (zh) 一种基于激光连续扫频的三维坐标测量装置及测量方法
JPS6269110A (ja) 光学的歪計測方法